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A robust Euclidean metric based ID extraction method using RO-PUFs in FPGA

Tran Faculty of Radio-Electronic Engineering, Le Quy Don Technical University, Hanoi, Viet Nam|
Van-Phuc (37034022300) | Quang-Kien (57188828840); Hoang | Van-Toan (57212191283); Trinh Institute of System Integration, Le Quy Don Technical University, Hanoi, Viet Nam|

Integration Số , năm 2022 (Tập 82, trang 37-47)

ISSN: 1679260

ISSN: 1679260

DOI:

Tài liệu thuộc danh mục:

Article

English

Từ khóa: Extraction; Hamming distance; Hardware security; Chip authentications; Euclidean metrics; Extraction method; Global variations; Highly-correlated; Local variations; Operating condition; Oscillator frequency; PUF; Ring oscillator; Field programmable gate arrays (FPGA)
Tóm tắt tiếng anh
Main problems in FPGA-based ring oscillator (RO) PUFs are that the RO frequencies are highly sensitive to operating conditions and other types of global variations. In addition, the RO frequencies are highly correlated by local variations. Therefore, in practice, conventional RO-PUF application schemes using Hamming distance normally require complex identification (ID) extraction algorithms and/or a large number of ROs to ensure a high level of uniqueness and reliability of the extracted IDs. In this work, we proposed a novel scheme of ID extraction based on Euclidean distances. Our proposed scheme stably and reliably generates the ID using a non-selective small number of ROs. Specifically, the generated IDs are mostly non-sensitive to global variables and operating conditions such as ambient temperature. In oppose to Hamming-based extraction, the close-frequencies ROs are normally removed to avoid flipping bits, our proposed scheme takes all those into account and simplifies the extraction process. Experiments on our available hardware have shown a very good level of reliability and uniqueness with ID collision rate is estimated less than 2×10−9. © 2021 Elsevier B.V.

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