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Real-Time Force Reconstruction in a Transverse Dynamic Force Microscope
IEEE Transactions on Industrial Electronics Số 11, năm 2022 (Tập 69, trang 11403-11413)
ISSN: 2780046
ISSN: 2780046
DOI:
Tài liệu thuộc danh mục:
Article
English
Từ khóa: Digital devices; Field programmable gate arrays (FPGA); Fixed point arithmetic; Microscopes; Nanotechnology; Parameter estimation; Scanning probe microscopy; Digital designs; Dynamic force microscopes; Interaction forces; Measurements of; Observer; Parameters estimation; Real- time; Scanning-probe microscopy; System Dynamics; Transverse dynamics; Digital filters
Tóm tắt tiếng anh
One major functionality of force microscopes is their ability to measure forces at a high sensitivity, thereby, allowing understanding of vital mechanisms: for instance, in bio-specimens. The investigation of a specimen's viscoelasticity on nano-scale can have significant scientific impact, but has been inhibited by the lack of fast, comprehensive scanning instruments. In principle, transverse dynamic force microscopes (TDFMs) permit the measurement of interaction forces within delicate samples in a noncontact manner. The force measurements are reconstructed via complicated offline analysis in TDFMs, therefore, they can hardly be utilized as an online force measuring tool. This article introduces a novel integrated robust design for practical scanning using the TDFM system. The digital design is implemented in fixed-point arithmetic using field programmable gate array devices, thereby, permitting measurement of the interaction force at a high sampling rate. The novel digital design tackles different implementation issues achieving fast and robust force measuring performance. This enables a new force-scan mode for the TDFM, realizing for the first time, online force mapping of sample-surfaces in real-time. 1982-2012 IEEE.